Since 1939, Hitachi has developed and manufactured various Electron Microscopes including unique tabletop and ultrahigh voltage as well as SEM, TEM and FIB.
Hitachi High-Tech Launches New Tabletop Microscopes with Enhanced Usability: TM4000PlusIII and TM4000III
Hitachi High-Tech Corporation (“Hitachi High-Tech”) announced today the global launch of TM4000PlusIII (“TM4000PlusIII”) and TM4000III (“TM4000III”) Tabletop Microscopes
Check out the most viewed application in August !
[Materials] CL (cathodoluminescence) imaging of ZnO (Zinc Oxide) particles
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Don’t miss top 3 most viewed applications posted in November !
#1
[Materials] High quality TEM lamella prep of Aluminum
#2
[Materials] CL imaging of TiO2
#3
[Electronics] Dopant profiling of NMOS transistor
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Don’t miss top 3 most viewed applications posted in December !
#1
[Materials] Cross-sectional SEM of CFRP
#2
[Materials] Negative stain TEM of Grease thickener
#3
[Electronics] Wide area cross sectional ion milling of Ceramic Capacitor
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Don’t miss top 3 most viewed applications posted in October !
#1
[Materials] CL imaging of Phosphor particles & GaN using UVD
#2
[Life] Cryo-TEM of Liposomes
#3
[Life] 3D Imaging of HeLa Cell using FIB-SEM
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Check out the most viewed application in May !
[Electronics] STEM-in-”FIB-SEM” of SRAM
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#electronmicroscopy
Check out the most viewed application in July !
[Electronics] 3D structural analysis of a 128-layer 3D NAND flash memory
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Check out the most viewed application in April !
[Electronics] 3D observation of 7 nm SRAM memory cells
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here're top 3 most viewed applications posted in June.
#1
TEM/STEM of MRAM (Magnetoresistive Random Access Memory)
#2
Low-voltage & Low-vacuum SEM of various food samples
#3
CLEM of Zircon particle
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Check out the most viewed application in June !
[Materials] Needle shape preparation on a Diamond sample
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Top 3 most viewed applications on this account, posted in Sept.
#1
200 kV BSE imaging of MWCNT & SrTiO3
#2
TEM of Cellulose Nanofibers using Ionic Liquid
#3
SEM of Reverse Osmosis Membrane under "dry" & "Ionic Liquid wet" conditions
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Here are top 3 most viewed applications on this account, posted in August.
#1
Cryo SEM of ice cream (freeze-fractured)
#2
STEM/EDX of GaN nanowires
#3
Correlative SEM-AFM of PS-PMMA copolymer
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Top 3 applications posted in November !
#1
Atom Probe Sample Prep of GaInN/GaN MQW using STEM image
#2
Broad Ion Beam milling of a Superhard Material using Higher Beam Tolerance Mask
#3
Montage of a Rock
Top 3 applications posted in December !
#1
"Steel inclusion analysis"
#2
"Low voltage SEM of various materials"
#3
"High-sensitivity EDX analysis of MOF membrane without shadowing effect"
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here're top 3 most viewed applications posted in June.
#1
Identification of foreign particle in multilayer film
#2
Ion milling of magnesium (Mg) alloy
#3
Serial Block Face imaging of Arabidopsis root
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Check out brand new Hitachi SU3800 & SU3900 SEMs !
Large and heavy samples can be observed and analyzed without cutting or cleaving.
Advanced automation enables speedy imaging and analysis together with wide area camera navigation.
Chocolate under electron microscope for Valentines Day.
Cross section of candy-coated chocolate prepared by cryo ion milling. Interface between chocolate & coating, dispersion of sugar crystals & eggshell calcium clearly observed without thermal damage.
Happy Holidays !
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“Lucky Clover”
(Low vacuum SEM of Glandular Trichomes on an uncoated Cherry Tomato)
This work was presented at the "photo contest" hosted by the Japanese Society of Microscopy.
Little sister of TM4000Plus LEGO.
Now visiting Sydney for IMC19 (The 19th International Microscopy Congress).
Stop by our booth 71 at The International Convention Centre, Sydney (ICC Sydney) !
H-9000, 300 kV ultrahigh resolution electron microscope series consisting of H-9000NA/NAR, H-9000UHR, and H-9000UHV, launched in 1986.
Its 10-stage acceleration tube provides ultrastable accelerating voltage up to 300 kV for higher resolution and penetration power.
Tabletop sample cleaner reduces contamination during SEM observation by ultraviolet light irradiation without damaging samples. Samples are irradiated by UV light prior to SEM observation to reduce hydrocarbon molecules adhered to the sample surface.
Come join us for “IV ENCONTRO TÉCNICO DE MICROSCOPIA ELETRÓNICA” in Coimbra, Portugal !
Date : Monday, Nov.11, 2019
Venue : Faculdade de Medicina da Universidade de Coimbra
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Webinar "SEM Surface Analysis Made Easy"
Please join us for our free webinar on Z-height measurements on SEM (Scanning Electron Microscope). Registration is required. Please register today!
Date/Time: Thursday, July 19, 2018, 2 PM EDT
Top 3 applications posted in September !
#1
SEM-EDS analysis of marine microplastics
#2
TEM analysis of TiO2 nanoparticles using Ionic Liquid
#3
3D reconstruction of Barium Soap Grease using cryo FIB-SEM
Cathode of Li ion battery was imaged with SE and low energy loss BSE. While the shape of tiny particles on active materials was observed in SE, the distribution was clearly visualized in BSE with enhanced material contrast.
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One of our bestselling FE-SEMs, S-800, launched in 1981 with ultrahigh vacuum, novel flashing technology to clean FE tip surface and microcomputer controlled extraction voltage achieving world highest resolution of the time (2 nm)
Lamella of Bi2Se3 prepared for atomic resolution analysis using FIB-SEM-Ar triple beam with 1 kV Ar ion finishing. While atomic columns of Bi and Se were clearly observed in ADF-STEM image, atomic sites of Bi and Se were distinctly visualized in EDX map.
A cross section of MOS transistor was prepared using FIB and ion milling. While the section prepared with only FIB did not show enough contrast, additional Ar ion milling allowed high-contrast observation of dopant layers.
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One of our bestselling FE-SEMs, S-4500, launched in 1992 with cold field emission electron source and semi in-lens (snorkel lens) system
allowing ultrahigh resolution imaging of large samples, especially at low accelerating voltage (4.0 nm at 1 kV).
Happy World Algae Day !
(October 12th)
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SEM of single-celled algae, Staurastrum sp. prepared using Ionic Liquid
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This work was presented at the "photo contest" hosted by the
H-800, 200 kV high resolution analytical electron microscope offering TEM, STEM, SEM, EDX, EELS, etc., launched in 1982.
Its built-in microcomputer and 5-stage imaging lens system allowed unprecedented image rotation free zooming.
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Ionic liquid was applied to observe a non-conductive highly porous material, aerogel, without charging. Porous surface structure was clearly visualized and pores down to 5 nm were observed at high magnification.
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#Ionicliquid
#aerogel
A cross section of SiC power device was prepared using FIB and ion milling. While the section prepared with only FIB did not show enough contrast, additional Ar ion milling enabled high-contrast observation of dopant layers.
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#dopant
#SiC
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